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HighQ |
SuperQ |
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Ø Tip curvature radius: ü Guaranteed < 20 nm ü Typical: 10 nm ü Each tip is SEM controlled |
Ø Tip curvature radius: ü Guaranteed < 10 nm ü Typical: 7 nm ü Each tip is SEM controlled ü Supplied with SEM photo for each tip |
Ø High reflective Au coating. Chemically stable, reflectivity 3 times better than for uncoated cantilevers).
Ø Available with conductive TiN, W2C, Pt, Au and magnetic Co-Ni coatings (typical 20 nm layer thickness).
Ø Tip height: ≥ 7µm.
Ø Tip cone angle: ≤ 22º
Ø Tip base diameter: ≤ 8 um
Ø Distance between lever edge and tip base center: ≈ 6 um
Ø Tilt angle between lever edge and cantilever chip surface normal: ≈ 2 º
Ø Detection area of cantilever deflection at: ≈ 1/3 cantilever length
Ø Standard chip size: 1.6x3.6x0.4 mm.
Ø Chip thickness: 350 ¸ 450 um
Ø Available for NONCONTACT, SEMICONTACT and CONTACT modes.
Ø Triangular and rectangular cantilevers.
Ø Packaged in GelPak® boxes.
Ø Compatible with the all commercial Atomic Force Microscopes.
Ø Anti-electrostatic, Boron doped silicon. Doping level about 5x1020 cm-3.
Magnetic: cantilevers with a magnetic coating. Whiskers: cantilevers with a long very sharp tip made of carbin.
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