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AIST-NT SPM Systems
A new experience @ the Nano scale
Over the last 1,5 years the AIST-NT SPM engineers have developed a revolutionary new SPM concept that breaks with the limits of current AFM instruments and now enables researchers to use the power of an SPM without being an SPM expert.
Key innovations
> Quick start and scan (first scan tipically within one minute)
> Automatic cantilever alignment, adjustment and characterisarion for all commercial tips
> Fast Snap-out / Snap-in sample exchange
> Fast and easy tip-exchange
> Multi cantilevered chip operation
> All AFM, STM and SNOM modes onboard
> Tip-preserving True Non-Contact approach, scanning and safe remote
> Invisible laser for perfect optical view and interference-free NanoRaman operation
> Ultra high scan speed (at least 10 x faster than any commercial alternative)
> Computer controlled sample positioning
> Top, Side & Bottom open optical access
> Atomic resolution with 100 x 100 x 10 um scanner
> Thermal compensated orthogonal closed-loop scan motion through unique scanner design
> Metrology down to molecular scale
> Total drift compensation
> Ultra long-time position stability
> One-step zoom seamless and precise
> Ultra speed multi-channel 100% digital DSP control
> Modular expandable controller with USB-2 interface
> Compact industrial design
> Noise and vibration insensitive due to extreme stiff and High-Resonance design
> Remote control for glove-box operation
> Design Of Experiment ready
> Intuitive user interface with interactive step-guide for easy operation
> Powerful control software with a macro programming suit for advance operation
> Designed for integration with spectral surface analysis techniques for scanning TERS performance
Atomic resolution of highly oriented pyrolytic graphite, 3 nm scan.
Obtained with the new 100 x 100 x 15 micron scanner.
